Failure research on an optoelectronic fail-safe logical circuit

Author

Christov, Kalin ; Mitev, Kalojan ; Stoytcheva, Nelly

Author_Institution

Dept. of Commun. & Safety Syst., Todor Kableshkov Higher Sch. of Transp., Sofia, Bulgaria

fYear

2003

fDate

8-11 May 2003

Firstpage

355

Lastpage

358

Abstract

The optoelectronic logical circuits are ones of the most various circuits that are used in the railway signaling systems. They are referring to circuits with external pulse cycle. In recent years there have been several publications on such circuits. In this paper is proposed the technique for research of theirs functional behavior with given criteria for fail-safe output reaction. PSpice analyses for the circuit behavior are developed with OrCad tools when input parameters are given. Different faults are simulated and the fail-safe behavior is analyzed. Different graphical results are worked out. The problem of circuit speed is investigated. Safety estimation of the scheme is done in conclusion.

Keywords

SPICE; failure analysis; fault simulation; integrated optoelectronics; logic CAD; logic circuits; optoelectronic devices; railway safety; OrCad tools; PSpice analysis; circuit behavior; external pulse cycle; fail-safe logical circuit; fail-safe output reaction; fault simulation; functional behavior; optoelectronic logic circuit; railway signaling systems; safety estimation; Circuit analysis; Circuit faults; Communication system signaling; Control systems; Electrical equipment industry; Fault tolerant systems; Rail transportation; Railway safety; Safety devices; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on

Print_ISBN

0-7803-8002-9

Type

conf

DOI

10.1109/ISSE.2003.1260550

Filename

1260550