Computation of light scattered into a detector

Author

Marx, E.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

4

fYear

2000

fDate

16-21 July 2000

Firstpage

2116

Abstract

To compare a the computed bidirectional reflectance distribution function (BRDF) or intensity distribution of a rough surface to a measured one we have to consider at least three issues beyond the computation of the intensity as a function of the scattering angle: the convolution with the instrument signature; averaging over intervals to take into account the specular peak and speckle; and the inclusion of a windowing function in the Kirchhoff approximation. Integration over the detector aperture can replace the convolution with the instrument signature.

Keywords

approximation theory; convolution; light scattering; photodetectors; rough surfaces; speckle; Kirchhoff approximation; averaging; bidirectional reflectance distribution function; convolution; detector aperture; instrument signature; integration; intensity distribution; light scattering; rough surface; scattering angle; speckle; specular peak; windowing function; Bidirectional control; Convolution; Distributed computing; Distribution functions; Instruments; Kirchhoff´s Law; Light scattering; Rough surfaces; Speckle; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2000. IEEE

Conference_Location

Salt Lake City, UT, USA

Print_ISBN

0-7803-6369-8

Type

conf

DOI

10.1109/APS.2000.874911

Filename

874911