DocumentCode :
2505454
Title :
Computation of light scattered into a detector
Author :
Marx, E.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
4
fYear :
2000
fDate :
16-21 July 2000
Firstpage :
2116
Abstract :
To compare a the computed bidirectional reflectance distribution function (BRDF) or intensity distribution of a rough surface to a measured one we have to consider at least three issues beyond the computation of the intensity as a function of the scattering angle: the convolution with the instrument signature; averaging over intervals to take into account the specular peak and speckle; and the inclusion of a windowing function in the Kirchhoff approximation. Integration over the detector aperture can replace the convolution with the instrument signature.
Keywords :
approximation theory; convolution; light scattering; photodetectors; rough surfaces; speckle; Kirchhoff approximation; averaging; bidirectional reflectance distribution function; convolution; detector aperture; instrument signature; integration; intensity distribution; light scattering; rough surface; scattering angle; speckle; specular peak; windowing function; Bidirectional control; Convolution; Distributed computing; Distribution functions; Instruments; Kirchhoff´s Law; Light scattering; Rough surfaces; Speckle; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
Type :
conf
DOI :
10.1109/APS.2000.874911
Filename :
874911
Link To Document :
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