Moment method simulations of electromagnetic scattering from conducting random rough surfaces using wavelet basis

Electromagnetic (EM) scattering from randomly rough surfaces has drawn an increasing attention due to its important applications in remote sensing of the ocean, soil and ice. The proposed wavelet approach is numerically exact, without limitations on the RMS height and slope. The accuracy we want is exclusively controlled by the sparseness of the impedance matrix, which is demonstrated in the order of O(/spl beta/log/sub 2/N/sub x//N/sub x/). This conclusion is drawn based on taking the bistatic scattering coefficient (BSC) predictions as the simulation objectives, and an eight point sampling per linear wavelength is assumed.