• DocumentCode
    2505686
  • Title

    A novel method to rapidly determine the key properties of thermoelectric devices

  • Author

    En-Ting Chu ; Heng-Chieh Chien ; Huey-Lin Hsieh ; Jing-Yi Huang ; Chun-Kai Liu ; Da-Jeng Yao

  • Author_Institution
    Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    93
  • Lastpage
    98
  • Abstract
    This article presents a novel method to determine the representative properties of a thermoelectric module (TEM). The method, by applying a constant current to a thermoelectric module then measuring the module´s transient voltage and both sides temperatures, could rapidly determine the module´s effective properties. The properties include Seebeck coefficient (S), electrical resistance (R), and thermal conductance (K). A commercial module, Altec1091, had been measured in this study, the test data shows a good agreement with previous literatures results.
  • Keywords
    thermoelectric devices; Seebeck coefficient; TEM; electrical resistance; module transient voltage measurement; test data; thermal conductance; thermoelectric devices; thermoelectric module; Current measurement; Electrical resistance measurement; Resistance; Temperature measurement; Thermal conductivity; Transient analysis; Voltage measurement; Seebeck coefficient; electrical resistance; measurement; thermal conductivity; thermoelectric module;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231418
  • Filename
    6231418