Title :
Aperiodic resonant excitation of microprocessor power distribution systems and the reverse pulse technique
Author :
Drabkin, Victor ; Houghton, Chris ; Kantorovich, Isaac ; Tsuk, Michael
Author_Institution :
Hewlett-Packard Co., Shrewsbury, MA, USA
Abstract :
This paper details a method of determining the worst-case excursion of the voltage in a microprocessor power distribution system, taking into account architectural limitations on variations in required current.
Keywords :
electric potential; microprocessor chips; power supply circuits; time-domain analysis; aperiodic resonant excitation; architectural specifications; circuit model; microprocessor power distribution system; reverse pulse technique; supply current variation; time-domain variation; worst-case voltage excursion; Circuits; Clocks; Frequency domain analysis; Impedance; Microprocessors; Power distribution; Power system modeling; Resonance; Switches; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7451-7
DOI :
10.1109/EPEP.2002.1057909
