• DocumentCode
    2505989
  • Title

    The Growth of High Quality Quartz in Commercial Autoclaves

  • Author

    Armington, Alton F. ; Balascio, Joseph F.

  • fYear
    1985
  • fDate
    29-31 May 1985
  • Firstpage
    230
  • Lastpage
    233
  • Keywords
    Aluminum; Atomic measurements; Etching; Frequency; Impurities; Mass spectroscopy; Paramagnetic resonance; Plasma measurements; Plasma temperature; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    39th Annual Symposium on Frequency Control. 1985
  • Conference_Location
    Philadelphia, Pennsylvania, USA
  • Type

    conf

  • DOI
    10.1109/FREQ.1985.200849
  • Filename
    1537789