Title :
Measurement methods for curing properties of resin considering process condition
Author :
Takeda, Tomohiko ; Yu, Qiang ; Sato, Hiroyuki
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Yokohama, Japan
fDate :
May 30 2012-June 1 2012
Abstract :
The authors have found that the Young´s Modulus and the shrinkage behavior of the packaging resin are greatly affected by the constraint condition, especially during the curing process. The purposes of this study are to propose the measuring method of property of the resin considering the process condition and to verify the results from experimental and analytical models. Therefore, it has been understood to have to use the curing property with considering the real packaging conditions.
Keywords :
Young´s modulus; curing; electronics packaging; resins; shrinkage; Young´s modulus; curing property; measurement method; packaging resin; shrinkage behavior; Curing; Packaging; Resins; Semiconductor device measurement; Strain; Temperature measurement; Young´s modulus; Constrain; Shrinkage strain; Structure; Young´s Modulus;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231438