DocumentCode :
2506011
Title :
Measurement methods for curing properties of resin considering process condition
Author :
Takeda, Tomohiko ; Yu, Qiang ; Sato, Hiroyuki
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Yokohama, Japan
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
256
Lastpage :
260
Abstract :
The authors have found that the Young´s Modulus and the shrinkage behavior of the packaging resin are greatly affected by the constraint condition, especially during the curing process. The purposes of this study are to propose the measuring method of property of the resin considering the process condition and to verify the results from experimental and analytical models. Therefore, it has been understood to have to use the curing property with considering the real packaging conditions.
Keywords :
Young´s modulus; curing; electronics packaging; resins; shrinkage; Young´s modulus; curing property; measurement method; packaging resin; shrinkage behavior; Curing; Packaging; Resins; Semiconductor device measurement; Strain; Temperature measurement; Young´s modulus; Constrain; Shrinkage strain; Structure; Young´s Modulus;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231438
Filename :
6231438
Link To Document :
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