DocumentCode
2506011
Title
Measurement methods for curing properties of resin considering process condition
Author
Takeda, Tomohiko ; Yu, Qiang ; Sato, Hiroyuki
Author_Institution
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Yokohama, Japan
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
256
Lastpage
260
Abstract
The authors have found that the Young´s Modulus and the shrinkage behavior of the packaging resin are greatly affected by the constraint condition, especially during the curing process. The purposes of this study are to propose the measuring method of property of the resin considering the process condition and to verify the results from experimental and analytical models. Therefore, it has been understood to have to use the curing property with considering the real packaging conditions.
Keywords
Young´s modulus; curing; electronics packaging; resins; shrinkage; Young´s modulus; curing property; measurement method; packaging resin; shrinkage behavior; Curing; Packaging; Resins; Semiconductor device measurement; Strain; Temperature measurement; Young´s modulus; Constrain; Shrinkage strain; Structure; Young´s Modulus;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231438
Filename
6231438
Link To Document