DocumentCode
2506053
Title
Accelerated testing of tin plated copper alloy contacts
Author
Malucci, Robert D.
Author_Institution
Molex Inc., Lisle, IL, USA
fYear
1997
fDate
20-22 Oct. 1997
Firstpage
138
Lastpage
151
Abstract
Thermal cycling tests conducted on tin plated contacts were used in conjunction with materials aging data to develop a fretting degradation model. Parameters such as thermal swing, temperature extremes, dwell times and number of cycles are incorporated in the model to account for aging processes such as micro-motion, oxidation rate and stress relaxation. In addition, algorithms were developed to simulate the levels of oxidation, stress relaxation and intermetallic compound formation that occur under various field and accelerated test conditions. These algorithms and the fretting model were used to evaluate various test exposures of tin plated copper base alloy contacts in comparison to typical field conditions. The results indicate three of the four aging processes (fretting corrosion, oxidation and stress relaxation) can be simulated using standard test conditions. Moreover it was found that intermetallic compound formation could not be simulated without excessively accelerating the other processes. These results reveal oxidation rate and stress relaxation per cycle as important thermally activated processes that accelerate the rate of fretting corrosion degradation.
Keywords
ageing; copper alloys; corrosion; electrical contacts; electroplated coatings; life testing; oxidation; stress relaxation; tin; wear; accelerated testing; aging; algorithm; degradation model; fretting corrosion; intermetallic compound formation; micro-motion; oxidation; simulation; stess relaxation; thermal cycling; tin plated copper alloy contact; Aging; Copper alloys; Corrosion; Intermetallic; Life estimation; Oxidation; Testing; Thermal degradation; Thermal stresses; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1997., Proceedings of the Forty-Third IEEE Holm Conference on
Conference_Location
Philadelphia, PA, USA
Print_ISBN
0-7803-3968-1
Type
conf
DOI
10.1109/HOLM.1997.638006
Filename
638006
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