DocumentCode :
2506086
Title :
Mechanical and thermal response of compliant Thermal Interface Materials under cyclic loading
Author :
Chavali, S. ; Singh, Y. ; Subbarayan, G. ; Garimella, S.
Author_Institution :
Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
282
Lastpage :
289
Abstract :
Compliant Thermal Interface Materials (TIMs) or Gap pads are an important material set in many applications including automotive electronics. Commercially available Compliant TIMs exhibit significant time-dependent deformation under compression limiting their utility. While these materials are expected to enhance thermal transport by filling gaps, their (often viscoelastic) mechanical behavior is not well understood. Present work is aimed at the development of test procedures to identify time-dependent viscoelastic behavior of compliant TIMs and to correlate the mechanical response of the materials to experimentally measured effective thermal conductivity. Towards this end, a commercially available compliant TIM using dynamic mechanical tests on a specially constructed low-load mechanical tester at 25°C and 75°C. Sinusoidal displacement profiles are applied at frequencies ranging from 0.1/hr to 10/hr. The change in response as a result of cyclic loading, or softening due to cycling, is quantified over a period of 500 cycles. The eventual goal is to study the stresses transmitted to the solder joints through the TIMs as a result of applied pressures during heatsink assembly.
Keywords :
automotive electronics; heat sinks; solders; thermal conductivity; thermal management (packaging); viscoelasticity; TIM; automotive electronics; compliant thermal interface material; cyclic loading; dynamic mechanical test; gap pads; heat sink assembly; low-load mechanical tester; mechanical response; sinusoidal displacement; solder joints; temperature 25 C; temperature 75 C; thermal conductivity; thermal response; thermal transport; time-dependent deformation; time-dependent viscoelastic behavior; Conductivity; Loading; Materials; Strain; Stress; Temperature measurement; Thermal conductivity; Mechanical Behavior; Viscoelastic; dynamic mechanical tests; thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231441
Filename :
6231441
Link To Document :
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