DocumentCode :
2506113
Title :
Stress relaxation test of molding compound for MEMS packaging
Author :
Yeonsung Kim ; Hohyung Lee ; Seungbae Park ; Xin Zhang
Author_Institution :
Dept. of Mech. Eng., State Univ. of New York at Binghamton, Binghamton, NY, USA
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
290
Lastpage :
296
Abstract :
Polymer based materials are widely used in electronic packaging. The molding compound, in particular, comprises a significant portion of the package with the purpose of protecting the chips from the environment. Material characterization of molding compounds, therefore, has been a critical issue in predicting the thermo-mechanical behavior and reliability of electronic packaging. One of the distinctive features of polymers is viscoelasticity, which refers to an intermediate behavior between a solid and a liquid. To characterize time and temperature dependent characteristics of polymers, various test methods have been utilized. Among those methods, the stress relaxation test using dynamic mechanical analysis (DMA) is widely used. However, there are no standards or guidelines for performing stress relaxation test on molding compounds with DMA. In this study, DMA stress relaxation tests have been performed with the molding compound. The initial value of relaxation modulus from DMA was compared with the Young´s modulus from tensile test. The temperature effect on the stress relaxation test was studied to determine the appropriate temperature profile. The sample thickness and strain dependency were also investigated. Finally, recommendations for proper future testing are proposed.
Keywords :
circuit reliability; electronics packaging; micromechanical devices; moulding; polymers; stress relaxation; viscoelasticity; MEMS packaging; chip protection; dynamic mechanical analysis; electronic packaging reliability; intermediate behavior; material characterization; molding compound; polymer based material; sample thickness; strain dependency; stress relaxation testing; temperature dependent characteristics; thermo-mechanical behavior prediction; time dependent characteristics; viscoelasticity; Compounds; Fixtures; Materials; Strain; Stress; Temperature distribution; Temperature measurement; Dynamic Mechanical Analysis (DMA); Molding Compound; Relaxation Modulus; Viscoelasticity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231442
Filename :
6231442
Link To Document :
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