Title :
Efficient method of moment analysis based on imaging and edging
Author :
Kolundzija, B. ; Petrovic, V. ; Djordjevic, A. ; Sarkar, T.
Author_Institution :
Dept. of Electr. Eng., Belgrade Univ., Serbia
Abstract :
Electromagnetic modeling of composite metallic and dielectric structures (antennas, scatterers, microwave circuits, etc.) in the frequency domain can be efficiently performed by applying the method of moments (MoM) to the surface integral equations (SIEs). Particularly, a high efficiency is achieved by using double polynomial approximations for currents over quadrilateral patches, where expansion orders are directly proportional to the electrical length of these patches. The exception occurs when a global solution for currents is strongly affected by local quasi-static effects (end effect and proximity effect). For example, the authors consider a microstrip line whose transversal dimensions are small comparable with the wavelength. The main goal is to determine non-uniform segmentation which enables the treatment of local quasi-static effects with the lowest number of unknowns. In that sense two techniques are proposed: imaging and edging.
Keywords :
electric current; integral equations; method of moments; microstrip lines; polynomial approximation; waveguide theory; antennas; composite metallic/dielectric structures; double polynomial approximations; edging; efficient MoM analysis; electric current; electrical length; end effect; expansion orders; frequency domain; global solution; imaging; local quasi-static effects; method of moment analysis; microstrip line; microwave circuits; nonuniform segmentation; proximity effect; quadrilateral patches; scatterers; surface integral equations; transversal dimensions; wavelength; Dielectrics; Electromagnetic modeling; Electromagnetic scattering; Frequency domain analysis; Image analysis; Microwave antennas; Microwave circuits; Microwave imaging; Microwave theory and techniques; Moment methods;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
DOI :
10.1109/APS.2000.874953