Title :
On-chip antenna pattern measurement setup up to 325GHz
Author :
Klein, Bernhard ; Jenning, Michael ; Seiler, Patrick ; Wolf, Klaus ; Plettemeier, Dirk
Author_Institution :
Dept. for RF Eng., Tech. Univ. Dresden, Dresden, Germany
Abstract :
This paper presents a setup for on-chip antenna pattern measurements built on a commercially available wafer-prober. Since the measurements are performed in the near-field, a near-field to far-field transformation is included. First validation measurements at 60GHz show a high agreement with simulation data and the results of the ongoing measurements at 300 GHz with the measurement setup will be shown at the conference.
Keywords :
millimetre wave antennas; millimetre wave measurement; submillimetre wave antennas; submillimetre wave measurement; frequency 300 GHz; frequency 60 GHz; near-field to far-field transformation; on-chip antenna pattern measurement setup; wafer-prober; Antenna measurements; Electric variables measurement; Frequency measurement; Probes; Semiconductor device measurement; System-on-chip; Wavelength measurement; antenna measurement; fully-integrated system; integrated antenna; near-field measurement; on-chip antenna;
Conference_Titel :
Antennas and Propagation (ISAP), 2014 International Symposium on
Conference_Location :
Kaohsiung
DOI :
10.1109/ISANP.2014.7026587
