DocumentCode
2506246
Title
Design and modeling of a 3.2 Gbps/pair memory channel
Author
Yuan, Chuck ; Beyene, Wendemagegnehu ; Cheng, Newton ; Shi, Hao
Author_Institution
Rambus Inc., Los Altos, CA, USA
fYear
2002
fDate
21-23 Oct. 2002
Firstpage
227
Lastpage
230
Abstract
With the rapid advance of silicon process technology, it is now possible to design I/O circuits that operate at multi-gigabit data rates. Rambus´s next generation memory interface technology, code-named Yellowstone, utilizes bi-directional low-swing Differential Rambus Signaling Level (DRSL) with a data transfer rate starting at 3.2 Gbps/pair and scalable to 6.4 Gbps/pair. This paper describes the design and modeling methodology used to develop the Yellowstone memory channel with conventional interconnect technologies. First, the advantages of point-to-point differential signaling are discussed. Then, the design issues associated with low-cost conventional printed circuit boards (PCBs) and packages are described. This is followed by a discussion of the modeling issues associated with high data-rate channel design. A design and modeling methodology is proposed to ensure the robust operation of the Yellowstone memory channel. Finally, to illustrate the validity of the proposed modeling methodology, channel models are correlated with actual hardware at both component and system level in both time and frequency domains.
Keywords
digital circuits; digital storage; modelling; packaging; printed circuit design; 3.2 Gbit/s; I/O circuits; PCBs; Yellowstone memory channel; bi-directional low-swing DRSL; channel models; design methodology; differential Rambus signaling level; high data-rate channel design; interconnect technologies; memory interface technology; modeling methodology; multi-gigabit data rates; packages; point-to-point differential signaling; printed circuit boards; Bidirectional control; Design methodology; Frequency domain analysis; Hardware; Integrated circuit interconnections; Packaging; Printed circuits; Random access memory; Robustness; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-7451-7
Type
conf
DOI
10.1109/EPEP.2002.1057920
Filename
1057920
Link To Document