Outage probability and error rates of switched diversity systems in Hoyt fading channel

Simple closed-form expressions of outage probability and moment generating function (MGF) are found for a switch and examine combiner (SEC) operating over independent and identically distributed (IID) Hoyt fading channel. Next, using the derived MGF, symbol error probability (SEP) of different M-ary modulation schemes are calculated. In addition, an analytic framework is presented for calculation of optimum switching threshold that ensures minimum outage probability or minimum SEP. The analysis is quite general in the sense that it covers switch and stay combiner (SSC) and Rayleigh fading as special cases.