Title :
Preliminary research of standard for electrostatic discharge test method for LED chips
Author :
Yan Wei ; Yuan Chen ; Wang Chang ; Zhou Jin
Author_Institution :
Shanghai Res. Inst. of Microelectron. (SHRIME), Peking Univ., Shanghai, China
Abstract :
In this paper, the LED chips static characteristics and anti-static technology has been analyzed. Methods for researching anti-static standards of LED chips are proposed that establish a set of test equipment, configuration and procedure in assessing the electrostatic discharge performance of LED chips and even form semiconductor lighting LED chips anti-static testing standards. These four avenues outlined here as conducting internal analysis and description of ESD characteristics of LED chips made of different materials, researching the relationship between LED´s ESD performance and the growth process, studying the changes in the thermal resistance, luminous flux as well as in life expectancy of LED chips before ESD and after ESD and establishing typical discharge current waveform, testing range of grades, test equipment configuration, test procedure of LED chips.
Keywords :
electrostatic discharge; light emitting diodes; LED chips static characteristic; antistatic technology; discharge current waveform; electrostatic discharge test method; luminous flux; thermal resistance; Conducting materials; Electrostatic discharge; LED lamps; Life testing; Light emitting diodes; Materials testing; Performance analysis; Semiconductor device testing; Test equipment; Thermal resistance;
Conference_Titel :
Junction Technology (IWJT), 2010 International Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5866-0
DOI :
10.1109/IWJT.2010.5474903