Title :
Accuracy of dielectric constant measurement using the full-sheet-resonance technique IPC-TM-650 2.5.5.6
Author :
Deutsch, A. ; Huber, A. ; Kopcsay, G.V. ; Rubin, B.J. ; Hemedinger, R. ; Care, D. ; Becke, W. ; Winkel, T.-M. ; Chamberlin, B.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
The accuracy limitations of the full-sheet-resonance technique for extracting the dielectric constant of laminate materials used for printed-circuit-board wiring are presented over the frequency range 0.250 GHz to 2.2 GHz. It is shown that skin-effect and surface roughness introduce significant errors as materials become thinner than 10 mil. These effects result in over-prediction of /spl epsiv//sub r/´ and prevent determination of the /spl epsiv//sub r/´(f) variation.
Keywords :
laminates; measurement errors; permittivity measurement; printed circuit testing; resonance; skin effect; surface topography; 0.250 to 2.2 GHz; 10 mil; accuracy limitations; complex permittivity; dielectric constant measurement accuracy; frequency range; full-sheet-resonance technique IPC-TM-650 2.5.5.6; laminate materials; printed-circuit-board wiring; skin-effect errors; surface roughness errors; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Frequency; Optical propagation; Permittivity; Wiring;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7451-7
DOI :
10.1109/EPEP.2002.1057939
