DocumentCode
2506705
Title
AQUAIA: a CAD tool for on-chip interconnect modeling, analysis, and optimization
Author
Elfadel, M. ; Anand, M.B. ; Deutsch, A. ; Adekanmbi, O. ; Angyal, M. ; Smith, H. ; Rubin, B. ; Kopcsay, G.
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2002
fDate
21-23 Oct. 2002
Firstpage
337
Lastpage
340
Abstract
The development of CAD tools for the modeling, analysis, and optimization of on-chip interconnect structures presents many challenges not found in the context of electronic package design and analysis. In this paper, we summarize these challenges and report on a new tool called AQUAIA that addresses them based on the physics of electrical parameter modeling of on-chip interconnects. Specifically, we show how the complexities of on-chip interconnect modeling and analysis can be contained using predefined, representative, three-dimensional signal and power interconnect templates fully compatible with the metal/dielectric back-end-of-the-line (BEOL) stack. These templates enable the fast modeling and simulation of delay, rise/fall time, and crosstalk of signal nets that fully account for the emerging problems of on-chip wiring, including inductive effects and broadband frequency dependence. We also give examples of how to use AQUAIA for interconnect design verification, wiring rule generation, and BEOL process integration.
Keywords
VLSI; circuit CAD; circuit optimisation; crosstalk; delay estimation; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; 3D power interconnect templates; 3D signal interconnect templates; AQUAIA; BEOL process integration; CAD tool; back-end-of-the-line stack; broadband frequency dependence; chip interconnect optimization; crosstalk simulation; delay simulation; electrical parameter modeling; electronic pack-age design; inductive effects; interconnect design verification; metal/dielectric BEOL stack; on-chip interconnect modeling; on-chip wiring; rise/fall time simulation; wiring rule generation; Context modeling; Crosstalk; Delay effects; Design automation; Design optimization; Dielectrics; Electronics packaging; Physics; Signal analysis; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-7451-7
Type
conf
DOI
10.1109/EPEP.2002.1057945
Filename
1057945
Link To Document