Title :
Three test problems for the comparison of lossy transmission line algorithms
Author :
Ruehli, Albert E. ; Cangellaris, A.C. ; Huang, H.-M.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
In this note, three models are provided for the analysis of lossy transmission lines in support of the papers in the special session (IEEE 11th Topical Meeting on Electrical Performance of Electronic Packaging, 2002). The models are used for a one-to-one comparison between the transmission line transient analysis techniques presented in the papers in this session.
Keywords :
coupled transmission lines; network analysis; transient analysis; transmission line matrix methods; coupled transmission lines; frequency dependent capacitance matrix; lossy transmission line algorithm test problems; lossy transmission line analysis; transmission line transient analysis techniques; Capacitance; Communication cables; Distributed parameter circuits; Frequency dependence; Power cables; Propagation losses; Testing; Transient analysis; Transmission line matrix methods; Transmission lines;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7451-7
DOI :
10.1109/EPEP.2002.1057947
