Title :
Solder joint grain boundary structure and diffusivity via molecular dynamics simulations
Author :
Basaran, Cemal ; Sellers, Michael S. ; Schultz, Andrew J. ; Kofke, David A. ; Lee, Yongchang
Author_Institution :
Dept. of Civil, Struct. & Environ. Eng., Univ. at Buffalo, The State Univ. of New York, Buffalo, NY, USA
fDate :
May 30 2012-June 1 2012
Abstract :
We investigate the effect of various amounts of Ag and Cu solute atoms on the self-diffusivity of Sn in the (101) symmetric tilt βSn grain boundary. Using molecular dynamics (MD) simulations over a temperature range of 300K to 450K, we show that both Ag and Cu decrease the grain boundary self-diffusivity of Sn, as the amount of solute in the interface increases. Additionally, the presence of Ag at the grain boundary interface causes a greater reduction in the self-diffusivity of Sn when compared to Cu. We also analyze the solute effect on the diffusive width of the interface and find that low concentrations of both Ag and Cu shrink the width relative to the pure βSn interface.
Keywords :
copper alloys; grain boundary diffusion; molecular dynamics method; silver alloys; solders; tin alloys; MD simulations; SnAgCu; grain boundary self-diffusivity; molecular dynamic simulations; solder joint grain boundary structure; symmetric tilt grain boundary; temperature 300 K to 450 K; Atomic measurements; Computational modeling; Grain boundaries; Mathematical model; Temperature measurement; Tin; Molecular dynamics; diffusivity; grain boundary diffusivity; lead-free solder alloy; solute;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231473