DocumentCode :
2506938
Title :
Next generation testing technique for embedded software: abstract semantics analysis
Author :
Hote, Chris
Author_Institution :
PolySpace Technol. Inc., Boston, MA, USA
Volume :
2
fYear :
2004
fDate :
24-28 Oct. 2004
Abstract :
In this document, we discuss the power of abstract semantics analysis, a breakthrough technique that has been successfully applied to solve traditional software testing challenges in the embedded systems industry. This approach radically departs from conventional testing as it does not rely on random tests to analyze code robustness. The paper addresses what abstract semantics analysis is, how the technique works and why it is a more effective solution to run-time error detection and debugging.
Keywords :
embedded systems; error detection; program debugging; program testing; programming language semantics; abstract semantics analysis; breakthrough technique; debugging; embedded software; embedded systems industry; next generation testing technique; random tests; run time error detection; software testing; Automatic testing; Runtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 2004. DASC 04. The 23rd
Print_ISBN :
0-7803-8539-X
Type :
conf
DOI :
10.1109/DASC.2004.1390726
Filename :
1390726
Link To Document :
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