DocumentCode
2506989
Title
Two-phase flow boiling in a single layer of future high-performance 3D stacked computer chips
Author
Szczukiewicz, Sylwia ; Borhani, Navid ; Thome, John Richard
Author_Institution
Lab. of Heat & Mass Transfer (LTCM), Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
597
Lastpage
605
Abstract
The present study focuses on an experimental investigation of two-phase flow boiling in a silicon multi-microchannel evaporator, which emulates a single layer of a 3D stacked computer chip. The micro-evaporator is comprised of 67 parallel channels, each having a 100 × 100 μm2 cross-section area, and separated by 50 μm-wide fins. Two aluminium micro-heaters were sputtered onto the backside of the test section to provide two 0.5 cm2 heated areas in order to simulate the power dissipated by active component in 3D CMOS chips. The experiments were performed with a second identical test section having 50 μm-wide, 100 μm-deep, and 100 μm-long restrictions (micro-orifices) at the inlet of each channel to stabilize the two-phase flow. The goal of this experimental campaign was to perform simultaneous high-speed flow visualization and infra-red measurements of the two-phase flow and heat transfer dynamics across the entire micro-evaporator area. Refrigerants R245fa, R236fa and R1234ze(E) were chosen as the working fluids. The micro-orifices successfully suppressed back flow, eliminated flow instabilities, provided a good flow distribution, and started the boiling process with some flashed vapor. Thermal performance was found to be uniform widthwise using these orifices.
Keywords
CMOS integrated circuits; boiling; cooling; elemental semiconductors; flow instability; flow visualisation; heat sinks; heat transfer; integrated circuit packaging; integrated circuit testing; microchannel flow; refrigerants; silicon; test facilities; thermal management (packaging); three-dimensional integrated circuits; two-phase flow; 3D CMOS chips; R1234ze(E) refrigerants; R236fa refrigerants; R245fa refrigerants; Si; aluminium microheaters; back flow suppression; flashed vapor; flow distribution; flow instability; heat transfer dynamics; high-performance 3D stacked computer chips; identical test section; infrared measurements; microorifices; parallel channels; silicon multimicrochannel evaporator; simultaneous high-speed flow visualization; size 100 mum; size 50 mum; thermal performance; two-phase flow boiling process; working fluids; Cameras; Fluids; Heat transfer; Heating; Refrigerants; Silicon; Temperature measurement; chip; cooling; evaporator; high-speed; infra-red; multi-microchannels; refrigerant; silicon; two-phase; visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231483
Filename
6231483
Link To Document