Title :
A new reliability evaluation method for embedded system
Author :
Yu, Jie ; Zhou, Xuehai
Author_Institution :
Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai
Abstract :
More frequent occurrence of soft error makes reliability evaluation become an important issue in the design of embedded system. This paper presents a new evaluation method of architectural vulnerability factor (AVF) which reflects the effects of soft error on the execution of program. This method evaluates AVF of storage units from three perspectives: instruction behavior, storage type and operation context on the storage units. Through classification of the ineffective instructions with which soft error will not affect the execution result of program, exploration of ineffective instructions could be performed. According to the storage type, ineffective bits which have no effect on the result of program are identified. With operation context, some cycles in which the occurrence of soft error has no effect on the result of program are identified. This method not only avoids the aimlessness of injection statistics of traditional method, but also provides an automatic analysis mechanism which extracts necessary information for evaluation. In the experiments, AVF evaluations for instruction queue in MIPS-like processor and ARM processor are made, thus to demonstrate the validity of this method.
Keywords :
embedded systems; software performance evaluation; software reliability; ARM processor; MIPS-like processor; architectural vulnerability factor; automatic analysis; embedded system design; embedded system reliability evaluation; injection statistics; instruction queue; Computer errors; Data mining; Design engineering; Embedded computing; Embedded system; Information analysis; Power system reliability; Reliability engineering; Statistical analysis; Statistics;
Conference_Titel :
Computer and Information Technology, 2008. CIT 2008. 8th IEEE International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-2357-6
Electronic_ISBN :
978-1-4244-2358-3
DOI :
10.1109/CIT.2008.4594678