• DocumentCode
    2507573
  • Title

    Learning GMM Using Elliptically Contoured Distributions

  • Author

    Li, Bo ; Liu, Wenju ; Dou, Lihua

  • Author_Institution
    Sch. of Autom., Beijing Inst. of Technol., Beijing, China
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    511
  • Lastpage
    514
  • Abstract
    Model order selection and parameter estimation for Gaussian mixture model (GMM) are important issues for clustering analysis and density estimation. Most methods for model selection usually add a penalty term in the objective function that can penalize the models and choose an optimal one from a set of candidate models. This paper presents a simple and novel approach to determine the number of components and simultaneously estimate the parameters for GMM. By introducing the degenerating model, the proposed approach overcomes the drawback of likelihood estimate that is a non-decreasing function and can not be used to select the number of components. The degenerating model is a more general form of mixture component density and it can degenerate into the component density or a crater-like density when its parameter K varies from 1 to a bigger value. The likelihood of the crater-like density evaluated for the training data approximates to zero. This characteristic of the degenerating model forms the foundation of the proposed approach. The experimental results show robust and evident performance improvement of the approach.
  • Keywords
    Gaussian distribution; Gaussian processes; GMM; Gaussian mixture model; clustering analysis; component density; crater-like density; density estimation; elliptically contoured distribution; model order selection; parameter estimation; Computational modeling; Density functional theory; Estimation; Gaussian distribution; Hidden Markov models; Programming; Training; Degenerating Model; EM Algorithm; Elliptically Contoured distributions; Finite Mixture Model; Generalized Multivariate Analysis; Kotz Type distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.130
  • Filename
    5597429