Title :
Dynamic thermal management of high heat flux devices using embedded solid-liquid phase change materials and solid state coolers
Author :
Green, Craig E. ; Fedorov, Andrei G. ; Joshi, Yogendra K.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
May 30 2012-June 1 2012
Abstract :
Dynamic operation and control is an essential tool for thermal management of a number of next generation electronic devices that suffer from localized hotspots with large heat fluxes. Due to limited cooling resources, the time that high heat flux devices can operate before load mitigation approaches must be employed is limited. To mitigate the spatial and temporal non-uniformities in chip temperature that result from dynamic power maps, the authors have introduced a novel thermal management approach that integrates solid-liquid phase change materials (PCMs) with an embedded heat spreader network directly into the die near the hotspots. This combined PCM-heat spreader network, or Composite Thermal Capacitor (CTC), gives the device a large increase in the local thermal capacitance near the hotspots. A prototype CTC that monolithically integrates micro heaters, PCMs and a Si spreader matrix into a test chip has been fabricated and shown to increase allowable device operating times by over 650% and address heat fluxes of up to ~395 W/cm2. Coupled to the CTCs are solid state coolers (SSCs) that deliver fast regeneration of the CTCs during throttling events. Experiments that couple thermoelectric coolers to the CTCs, show that system duty cycles of over 50% can be achieved.
Keywords :
capacitors; phase change materials; thermal management (packaging); thermoelectric cooling; CTC; PCM; chip temperature; combined PCM-heat spreader network; composite thermal capacitor; cooling resources; dynamic power maps; dynamic thermal management approach; embedded heat spreader network; embedded solid-liquid phase change materials; high heat flux devices; load mitigation approach; local thermal capacitance; microheaters; next generation electronic devices; solid state coolers; spatial nonuniformity; system duty cycles; temporal nonuniformity; test chip; thermoelectric coolers; throttling events; Diamond-like carbon; Heating; Performance evaluation; Phase change materials; Plasma temperature; Silicon; Core Migration; Hotspot; Multicore;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231516