DocumentCode
2507728
Title
Microstructural evolution and some unusual effects during thermo-mechanical Cycling of Sn-Ag-Cu alloys
Author
Kumar, P. ; Talenbanpour, B. ; Sahaym, U. ; Wen, C.H. ; Dutta, I.
Author_Institution
Dept. of Mater. Eng., Indian Inst. of Sci., Bangalore, India
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
880
Lastpage
887
Abstract
Sn-Ag-Cu (SAC) solders are susceptible to appreciable microstructural coarsening during storage or service. This results in evolution of joint properties over time, and thereby influences the long-term reliability of microelectronic packages. Accurate prediction of this aging behavior is therefore critical for joint reliability predictions. Here, we study the precipitate coarsening behavior in two Sn-Ag-Cu (SAC) alloys, namely Sn-3.0Ag-0.5Cu and Sn-1.0Cu-0.5Cu, under different thermo-mechanical excursions, including isothermal aging at 150°C for various lengths of time and thermo-mechanical cycling between -25°C and 125°C, with an imposed shear strain of ~19.6% per cycle, for different number of cycles. During isothermal aging and the thermo-mechanical cycling up to 200 cycles, Ag3Sn precipitates undergo rapid, monotonous coarsening. However, high number of thermo-mechanical cycling, usually between 200 and 600 cycles, causes dissolution and re-precipitation of precipitates, resulting in a fine and even distribution. Also, recrystallization of Sn-grains near precipitate clusters was observed during severe isothermal aging. Such responses are quite unusual for SAC solder alloys. In the regime of usual precipitate coarsening in these SAC alloys, an explicit parameter, which captures the thermo-mechanical history dependence of Ag3Sn particle size, was defined. Brief mechanistic description for the recrystallization of Sn grains during isothermal aging and reprecipitation of the Ag3Sn due to high number of thermo-mechanical cycles are also presented.
Keywords
ageing; copper alloys; crystal microstructure; crystallisation; dissolving; integrated circuit packaging; integrated circuit reliability; silver alloys; solders; tin alloys; SAC solders; Sn-Ag-Cu; aging behavior; dissolution; grain recrystallization; isothermal aging; joint reliability predictions; long-term reliability; microstructural evolution; precipitate clusters; precipitate reprecipitation; shear strain; temperature -25 degC to 125 degC; thermomechanical cycling; thermomechanical history dependence; Aging; Isothermal processes; Joints; Strain; Thermomechanical processes; Tin; Ag3 Sn; Sn-Ag-Cu; lead-free solder; microstructural coarsening; recrystallization;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231519
Filename
6231519
Link To Document