• DocumentCode
    2507728
  • Title

    Microstructural evolution and some unusual effects during thermo-mechanical Cycling of Sn-Ag-Cu alloys

  • Author

    Kumar, P. ; Talenbanpour, B. ; Sahaym, U. ; Wen, C.H. ; Dutta, I.

  • Author_Institution
    Dept. of Mater. Eng., Indian Inst. of Sci., Bangalore, India
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    880
  • Lastpage
    887
  • Abstract
    Sn-Ag-Cu (SAC) solders are susceptible to appreciable microstructural coarsening during storage or service. This results in evolution of joint properties over time, and thereby influences the long-term reliability of microelectronic packages. Accurate prediction of this aging behavior is therefore critical for joint reliability predictions. Here, we study the precipitate coarsening behavior in two Sn-Ag-Cu (SAC) alloys, namely Sn-3.0Ag-0.5Cu and Sn-1.0Cu-0.5Cu, under different thermo-mechanical excursions, including isothermal aging at 150°C for various lengths of time and thermo-mechanical cycling between -25°C and 125°C, with an imposed shear strain of ~19.6% per cycle, for different number of cycles. During isothermal aging and the thermo-mechanical cycling up to 200 cycles, Ag3Sn precipitates undergo rapid, monotonous coarsening. However, high number of thermo-mechanical cycling, usually between 200 and 600 cycles, causes dissolution and re-precipitation of precipitates, resulting in a fine and even distribution. Also, recrystallization of Sn-grains near precipitate clusters was observed during severe isothermal aging. Such responses are quite unusual for SAC solder alloys. In the regime of usual precipitate coarsening in these SAC alloys, an explicit parameter, which captures the thermo-mechanical history dependence of Ag3Sn particle size, was defined. Brief mechanistic description for the recrystallization of Sn grains during isothermal aging and reprecipitation of the Ag3Sn due to high number of thermo-mechanical cycles are also presented.
  • Keywords
    ageing; copper alloys; crystal microstructure; crystallisation; dissolving; integrated circuit packaging; integrated circuit reliability; silver alloys; solders; tin alloys; SAC solders; Sn-Ag-Cu; aging behavior; dissolution; grain recrystallization; isothermal aging; joint reliability predictions; long-term reliability; microstructural evolution; precipitate clusters; precipitate reprecipitation; shear strain; temperature -25 degC to 125 degC; thermomechanical cycling; thermomechanical history dependence; Aging; Isothermal processes; Joints; Strain; Thermomechanical processes; Tin; Ag3Sn; Sn-Ag-Cu; lead-free solder; microstructural coarsening; recrystallization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231519
  • Filename
    6231519