DocumentCode :
2507835
Title :
Manufacturing concerns of the electronic industry regarding intermetallic compound formation during the soldering stage
Author :
Blair, Howard D. ; Pan, Tsung-Yu ; Nicholson, John M. ; Cooper, Ronald P. ; Oh, Sung-Won ; Farah, Ahmad R.
Author_Institution :
Ford Motor Co., Dearborn, MI, USA
fYear :
1996
fDate :
14-16 Oct 1996
Firstpage :
282
Lastpage :
292
Abstract :
The intermetallic compound (IMC) formed at the interface between the solder and substrate is an inevitable result of the soldering process. It is an indication of good metallurgical bonding. But if it grows too thick, either during soldering or subsequent solid stage aging, it can have a deleterious effect on the strength of a joint or on the subsequent solderability of a component. Most of the literature studies have concentrated on the IMC growth during the solid stage aging. A few papers addressed the IMC formation during the molten stage, but most of these studies were in a temperature and time domain not applicable to the manufacturing soldering process. In this study, we examined the growth mechanism of the Cu6Sn5 IMC in the molten stage between 100Sn, 96.5Sn-3.5Ag, and 63Sn-37Pb solders on electroplated copper, which mimics the printed-wiring boards, and on rolled OFHC copper sheet, which simulates the component leads and electrical connectors
Keywords :
chemical interdiffusion; electron device manufacture; soldering; Cu-Sn; Cu-SnAg; Cu-SnPb; Cu6Sn5; component lead; electrical connector; electronic industry; electroplated copper; intermetallic compound formation; manufacturing; metallurgical bonding; printed-wiring board; rolled OFHC copper sheet; soldering; Aging; Bonding; Copper; Electronics industry; Intermetallic; Manufacturing processes; Pulp manufacturing; Soldering; Solids; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3642-9
Type :
conf
DOI :
10.1109/IEMT.1996.559744
Filename :
559744
Link To Document :
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