• DocumentCode
    2507971
  • Title

    Verification Under Increasing Dimensionality

  • Author

    Hendrikse, Anne ; Veldhuis, Raymond ; Spreeuwers, Luuk

  • Author_Institution
    Fac. EEMCS, Univ. of Twente, Enschede, Netherlands
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    589
  • Lastpage
    592
  • Abstract
    Verification decisions are often based on second order statistics estimated from a set of samples. Ongoing growth of computational resources allows for considering more and more features, increasing the dimensionality of the samples. If the dimensionality is of the same order as the number of samples used in the estimation or even higher, then the accuracy of the estimate decreases significantly. In particular, the eigenvalues of the covariance matrix are estimated with a bias and the estimate of the eigenvectors differ considerably from the real eigenvectors. We show how a classical approach of verification in high dimensions is severely affected by these problems, and we show how bias correction methods can reduce these problems.
  • Keywords
    covariance matrices; eigenvalues and eigenfunctions; higher order statistics; covariance matrix; eigenvalues; eigenvectors; sample dimensionality; second order statistics; verification decision; Covariance matrix; Distribution functions; Eigenvalues and eigenfunctions; Equations; Estimation; Principal component analysis; Training; General Statistical Analysis; bias correction; high dimensional verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.149
  • Filename
    5597446