DocumentCode :
2508236
Title :
Group Delay Measurements - a Sensitive Method for Detecting Spurious Crystal Resonances
Author :
Euler, Ferdinand K.
fYear :
1986
fDate :
28-30 May 1986
Firstpage :
295
Lastpage :
299
Keywords :
Delay; Electrical resistance measurement; Frequency measurement; Ovens; Phase detection; Phase frequency detector; Phase measurement; Resonance; Temperature distribution; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
40th Annual Symposium on Frequency Control. 1986
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1986.200957
Filename :
1537897
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2508236
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