DocumentCode
2508236
Title
Group Delay Measurements - a Sensitive Method for Detecting Spurious Crystal Resonances
Author
Euler, Ferdinand K.
fYear
1986
fDate
28-30 May 1986
Firstpage
295
Lastpage
299
Keywords
Delay; Electrical resistance measurement; Frequency measurement; Ovens; Phase detection; Phase frequency detector; Phase measurement; Resonance; Temperature distribution; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
40th Annual Symposium on Frequency Control. 1986
Conference_Location
Philadelphia, Pennsylvania, USA
Type
conf
DOI
10.1109/FREQ.1986.200957
Filename
1537897
Link To Document