DocumentCode :
2508250
Title :
Algorithm for analyzing optimal mask movement pattern in moving mask deep X-ray lithography
Author :
Matsuzuka, N. ; Tabata, Osamu
Author_Institution :
Fac. of Sci. & Eng., Ritsmeikan Univ., Shiga, Japan
fYear :
2002
fDate :
2002
Firstpage :
159
Lastpage :
164
Abstract :
Moving mask deep X-ray lithography has demonstrated its feasibility for fabricating some 3-dimensional (3D) microstructures such as micro-nozzles and micro-lens arrays and so on. In this technique, the determination of mask movement patterns is crucial for realizing the desired target microstructures. For theoretical determination of optimal movement patterns, an algorithm exploiting the Fourier transformation technique called "Inverse Approach" was proposed. As a first step towards the completion of the Inverse Approach, the algorithm limited to the 2 space dimensions, vertical and lateral, was developed. Straightforward application of this algorithm to the fabrication of V-shaped grooves did not yield satisfying results. We reported an adopted version of this algorithm which ultimately allowed successful fabrication of the V-shaped grooves. Furthermore, this algorithm could be applied to the determination of an optimal mask.
Keywords :
Fourier transforms; X-ray masks; Fourier transform; V-shaped groove fabrication; inverse approach; micro-lens array; micro-nozzle; moving mask deep X-ray lithography; optimal mask movement pattern algorithm; three-dimensional microstructure; Algorithm design and analysis; Fabrication; Inorganic materials; Mechanical systems; Micromechanical devices; Microstructure; Pattern analysis; Resists; Shape control; X-ray lithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micromechatronics and Human Science, 2002. MHS 2002. Proceedings of 2002 International Symposium on
Print_ISBN :
0-7803-7611-0
Type :
conf
DOI :
10.1109/MHS.2002.1058027
Filename :
1058027
Link To Document :
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