DocumentCode :
2508291
Title :
Numerical analysis of spreaders with an enhancing nucleate boiling surface for immersion cooling of chips with central hot spots
Author :
Ali, Amir F. ; El-Genk, Mohamed S.
Author_Institution :
Inst. for Space & Nucl. Power Studies, Univ. of New Mexico, Albuquerque, NM, USA
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
1106
Lastpage :
1113
Abstract :
Presented are the results of numerical thermal analysis of composite and plane cu spreaders for immersion cooling of an underlying 10 × 10 mm chip with a 1 × 1 mm or 2 × 2 mm CHS. The composite spreaders are comprised of a 1.6 - 3.2 mm thick cu substrate and an 80-μm thick MPC surface. The analysis varied the heat flux at CHS from 2 - 6 times the chip´s surface average outside the hot spot. Saturation nucleate boiling of PF-5060 dielectric liquid cools the surface of the spreader. Results demonstrated the effectiveness of the composite spreaders for mitigating the effect of the CHS by decreasing the chip maximum surface temperature and increasing the thermal power removed. Increasing the area and heat flux of CHS and decreasing the thickness of the cu substrate decrease the thermal power removed and the spreader footprint area. However, they increase the total thermal resistance of the spreader and the chip maximum surface temperature.
Keywords :
boiling; cooling; dielectric liquids; integrated circuit packaging; numerical analysis; thermal resistance; CHS heat flux; Cu; MPC surface; PF-5060 dielectric liquid; central hotspots; chip immersion cooling; chip maximum surface temperature; chip surface; composite spreader numerical thermal analysis; nucleate boiling surface; plane copper spreader numerical analysis; size 1.6 nm to 3.2 nm; size 80 mum; spreader footprint area; thermal power; total thermal resistance; Heating; Ocean temperature; Sea surface; Substrates; Surface impedance; Surface resistance; Thermal resistance; chips; composite spreader; hot spots; immersion cooling; micro-porous copper; nucleate boiling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231547
Filename :
6231547
Link To Document :
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