• DocumentCode
    2508314
  • Title

    Metallurgical considerations for accelerated testing of soft solder joints

  • Author

    Grossmann, Gunter ; Weber, Ludger ; Heiduschke, Klaus

  • Author_Institution
    Reliability Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    298
  • Lastpage
    304
  • Abstract
    The occurrence of new packages as well as the ongoing miniaturisation in SMT make the evaluation of the reliability of solder joints an permanent task. Accelerated testing, especially passive thermal cycling, is a important tool to evaluate the lifetime of solder joints. However, tin-lead solder behaves viscoplastically even at ambient temperature because of its low melting point and therefore the temperatures of the tests performed as well as the temperature change rate are very important parameters for testing. Different deformation rates cause different deformation mechanisms to occur. Therefore it is mandatory to take the metallurgical behaviour of tin-lead solder into account when accelerated tests are to be performed. However, many accelerated test performed in industry do not at all care for this fact: Temperature shock chambers are used in order to shorten the test time activating deformation mechanisms that do not occur in reality. Test chambers are overloaded, test specimen with high mass are tested or the specimen are placed with varying orientations to the air stream of the chamber not caring, which temperatures and temperature exchange rates occur in the solder joints
  • Keywords
    lead alloys; life testing; soldering; tin alloys; SMT; Sn-Pb; accelerated testing; deformation; lifetime; metallurgy; package; passive thermal cycling; reliability; soft solder joint; viscoplasticity; Capacitive sensors; Circuit testing; Creep; Grain boundaries; Lead; Life estimation; Performance evaluation; Soldering; Surface-mount technology; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559746
  • Filename
    559746