DocumentCode :
2508501
Title :
Delphi style compact modeling by means of genetic algorithms of system in Package devices using composite sub-compact thermal models dedicated to model order reduction
Author :
Monier-vinard, Eric ; Bissuel, Valentin ; Dia, Cheikh ; Daniel, Olivier
Author_Institution :
THALES GLOBAL SERVICES, Meudon la Foret, France
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
1170
Lastpage :
1178
Abstract :
Nowadays a high-level integration with unprecedented functionality and efficient performances is achieved through 3D packaging techniques known as System-In-Package (SIP). The paper describes the reduction process conducted on a realistic SIP module case in order to establish a behavioral thermal network having a large number of power sources. Besides this device has been slightly modified to focus on the recent 3D integration techniques such as the stacking of chip, multi-chips side by side architecture or the embedding of conventional individually-packaged Integrated Circuits (IC). These works compared the prediction of a DELPHI style Compact Thermal Model (CTM) to a numerical Detailed Thermal Model with for aim to illustrate the diminution of computation delays, the expected accuracy and some efficient ways to improve it. Then it describes the performance of a novel methodology that nests a set of Sub-Compact Thermal Models (SCTM) within the detailed numerical model, far less grid-intensive, and its ability to preserve the final SIP CTM quality.
Keywords :
genetic algorithms; numerical analysis; reduced order systems; system-in-package; three-dimensional integrated circuits; 3D integration techniques; 3D packaging techniques; CTM; Delphi style compact thermal modeling; SCTM; SIP CTM quality; behavioral thermal network; composite subcompact thermal models; computation delays; genetic algorithms; high-level integration; individually-packaged integrated circuits; model order reduction; numerical detailed thermal model; power sources; realistic SIP module; reduction process; subcompact thermal models; system in package devices; Bismuth; Computational modeling; Genetic algorithms; Heating; Junctions; Numerical models; Predictive models; Compact; SIP; algorithm; genetic; model; thermal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231555
Filename :
6231555
Link To Document :
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