DocumentCode :
2508569
Title :
The role of stoichiometry in low temperature grown GaAs for MESFET structures
Author :
Missous, M.
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
fYear :
1997
fDate :
24-25 Nov 1997
Firstpage :
109
Lastpage :
114
Abstract :
A detailed investigation of the growth conditions, including growth dynamics, has established that the non-stoichiometry of LT GaAs is not an intrinsic property but a perfectly controllable one leading to the possibility of growth of Stoichiometric Low temperature (SLT) GaAs. Epitaxial layers of both LT and SLT GaAs layers were grown and assessed as to their suitability as buffer layers in conventional MESFET structures. Both the mobility and charge density in the channel are shown to be strongly affected by the underlying buffer layer. Because of the control afforded in the growth of this structure using stoichiometric beams, a MESFET structure was entirely grown at the low growth temperature of 350°C and yet still retained high electrical and optical properties
Keywords :
Hall effect; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; molecular beam epitaxial growth; photoluminescence; semiconductor epitaxial layers; semiconductor growth; stoichiometry; 350 C; C-V measurements; GaAs; Hall effect; MESFET structures; buffer layers; channel charge density; channel mobility; electrical properties; epitaxial layers; growth conditions; growth dynamics; growth temperature; low temperature MBE growth; optical properties; photoluminescence; stoichiometric beams; stoichiometric low temperature GaAs; stoichiometry; Buffer layers; Conductivity; Gallium arsenide; Lattices; MESFETs; Molecular beam epitaxial growth; Optical buffering; Optical materials; Temperature control; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Electron Devices for Microwave and Optoelectronic Applications, 1997. EDMO. 1997 Workshop on
Conference_Location :
London
Print_ISBN :
0-7803-4135-X
Type :
conf
DOI :
10.1109/EDMO.1997.668582
Filename :
668582
Link To Document :
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