Title :
The Research on Software Test Pattern
Author :
Yi-chen, Wang ; Yi-kun, Wang
Author_Institution :
Dept. of Project Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
The purpose to introduce PATTERN into software test area is to solve the problem of repeatedly tested software and to diminish the uncertainty problem in software test, so that the efficiency and quality of software test will be improved. This paper will introduce the concept and the method of software test pattern; address the pattern system of software test. The basic parts of pattern research, including the requirement of pattern system, pattern types in three dimensional space, evolution of pattern system and how the pattern system supports software test will be discussed in detail. The ending part is the summary of the paper.
Keywords :
program testing; software quality; software test area; software test pattern; software test quality; Buildings; Presses; Runtime; Software design; Three dimensional displays; Uncertainty; pattern; pattern system; software test; software test pattern; test system;
Conference_Titel :
Future Computer Sciences and Application (ICFCSA), 2011 International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4577-0317-1
DOI :
10.1109/ICFCSA.2011.32
