DocumentCode :
2508667
Title :
Next generation testing tecrnique for embedded software: abstract semantics analysis
Author :
Hote, Chris
Volume :
2
fYear :
2004
fDate :
24-28 Oct. 2004
Firstpage :
514
Lastpage :
521
Keywords :
Application software; Computer industry; Computer science; Data analysis; Debugging; Embedded software; Embedded system; Missiles; Software testing; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 2004. DASC 04. The 23rd
Print_ISBN :
0-7803-8539-X
Type :
conf
DOI :
10.1109/DASC.2004.1390799
Filename :
1390799
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2508667
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