Title :
Durability assessment of photovoltaic (PV) products under environmental thermal cycling
Author :
Akman, J. ; Choi, C. ; Mukherjee, S. ; Meng, J. ; Mirbagheri, E. ; Haddad, G. ; Das, D. ; Dasgupta, A. ; Gaston, R. ; Kauffmann, K. ; Feng, J. ; Liu, H. ; Ramesh, N.
Author_Institution :
Mech. Eng. Dept., Univ. of Maryland, College Park, MD, USA
fDate :
May 30 2012-June 1 2012
Abstract :
Durability and reliability assessment is a key aspect of new product development. The focus of this paper is to assess the durability of the electrical joint of a PV product by examining its fatigue life under cyclic temperature excursions experienced throughout the product life cycle. An in progress method is presented for product life prediction as function of its deployment location. The life prediction approach consists of four parts: (i) collection and qualification of temperature history data from life cycle environments; (ii) thermal cycle modeling using 2D and 3D Finite Element Analysis (FEA); (iii) experimental characterization of metal joint fatigue data; (iv) damage accumulation modeling based on the previous parts in order to assess product durability.
Keywords :
durability; fatigue; finite element analysis; photovoltaic cells; product life cycle management; reliability; 2D finite element analysis; 3D finite element analysis; FEA; PV products; cyclic temperature excursions; damage accumulation; durability assessment; environmental thermal cycling; fatigue life; metal joint fatigue data; new product development; photovoltaic products; product life cycle assessment; product life prediction; reliability assessment; thermal cycle modeling; Fatigue; Force; Load modeling; Metals; Predictive models; Solid modeling; Thermomechanical processes; Palmgren-Miner Rule; Photovoltaic Module; Rainflow Cycle Counting; Thermal Fatigue;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231567