Title :
Magnetorestive Sensitivity Mapping at the Wafer Level with a Scanning Probe Microscope
Author :
Louder, D.R. ; Ryan, P.J. ; Schultz, Arturo E.
Author_Institution :
Seagate Technology
Keywords :
Hard disks; Image resolution; Image sensors; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic sensors; Magnetoresistance; Probes; Wiring;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742310
