Magnetic resonance in the submicron permalloy magnetic dots

Author

Moskaltsova, A. ; Nedukh, S.V.

Author_Institution

Nat. Tech. Univ. Kharkiv Polytech. Inst., Kharkiv, Ukraine

fYear

2011

fDate

6-8 Oct. 2011

Firstpage

141

Lastpage

144

Abstract

Ferromagnetic resonance response for X band in the arrays of the cylindrical submicron dots of the permalloy Ni₈₀Fe₂₀ was investigated. Resonance Magnetic field - resonance frequency dependences for arrays of nanodots with D = 4000 nm and D = 500 nm have a D = 300 nm been obtained. Approximation of the experimental data has been performed. The satisfactory coincidence of experimental data with the approximating curves has been achieved in suggestion of the additional field presence. It has been founded that the magnitude of this field in the investigated samples increases with the dot diameter decreasing. Besides that, the presence of the in-plane anisotropy in the samples of small diameter is most probably. The experimental results are confirmed by measurement of the angular dependence of resonance fields in plane of the film.

Keywords

Permalloy; ferromagnetic resonance; nanostructured materials; Ni₈₀Fe₂₀; X band; cylindrical submicron dots; ferromagnetic resonance response; in-plane anisotropy; nanodots; resonance frequency dependences; resonance magnetic field; submicron permalloy magnetic dots; Anisotropic magnetoresistance; Approximation methods; Magnetic fields; Magnetic resonance; Materials; Perpendicular magnetic anisotropy; Permalloy nanodisks; ferromagnetic resonance; nanostructures;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrodynamics and Mechatronics (SCE III), 2011 3rd International Students Conference on

Conference_Location

Opole

Print_ISBN

978-1-4244-9694-5

Type

conf

DOI

10.1109/SCE.2011.6092142

Filename

6092142