Title :
Measurement of the dielectric constant of medium loss cylindrical-shaped samples using cavity perturbation method
Author :
Banerjee, Prithu ; Ghosh, Gautam ; Biswas, Salil Kumar
Author_Institution :
Dept. of Phys., Univ. of Sci., Kolkata
Abstract :
In this paper an analytical formula for the measurement of the dielectric constant of materials having cylindrical shape is derived using cavity perturbation method. The formula is established using two known samples Teflon and Perspex at X-band frequencies and the results are compared with those obtained for rectangular samples.
Keywords :
dielectric materials; permittivity; perturbation theory; polymers; shapes (structures); Perspex; Teflon; X-band frequencies; cavity perturbation method; cylindrical shape; dielectric constant; Cavity perturbation methods; Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Erbium; Frequency; Loss measurement; Microwave measurements; Shape measurement; Dielectric constant; cylindrical-shaped sample; microwave frequencies; perturbation; rectangular cavity;
Conference_Titel :
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location :
Jaipur
Print_ISBN :
978-1-4244-2690-4
Electronic_ISBN :
978-1-4244-2691-1
DOI :
10.1109/AMTA.2008.4762975
