DocumentCode :
2509574
Title :
Technological challenges of advanced CMOS processing and their impact on design aspects
Author :
Claeys, Cor
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2004
fDate :
2004
Firstpage :
275
Lastpage :
282
Abstract :
The International Technology Roadmap for Semiconductors (ITRS) foresees the production of sub 10 nm gate length devices before 2016. To achieve this, both front- and back-end processing have to face major technological challenges and innovations. Lithography, device isolation, gate stack, shallow junctions, device engineering, high- and low-k dielectrics and interconnect schemes are hot research issues necessitating a global collaboration and the formation of appropriate platforms for joint research and development. Non-standard materials will have to be introduced and the use of non-classical device architectures will be required. This paper reviews some of the on-going research efforts to come to cost effective solutions forming the backbone for future technology nodes. Special attention is given to the impact of these technological innovations on design aspects. An outlook is also given of the emerging technologies that are at the basis of the switch over from micro-to nanoelectronics.
Keywords :
CMOS integrated circuits; dielectric materials; isolation technology; lithography; nanoelectronics; research and development; satellite computers; semiconductor device metallisation; technological forecasting; 10 nm; advanced CMOS processing; back end processing; complementary metal oxide semiconductor; device isolation; dielectrics; front end processing; gate stack; international technology roadmap for semiconductors; lithography; metallization; microelectronics; nanoelectronics; research and development; technological innovations; CMOS process; CMOS technology; Dielectric devices; Face; International collaboration; Isolation technology; Lithography; Production; Switches; Technological innovation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
Type :
conf
DOI :
10.1109/ICVD.2004.1260936
Filename :
1260936
Link To Document :
بازگشت