• DocumentCode
    2509581
  • Title

    Energy leakage in low power embedded operating systems using DVFS policy

  • Author

    Ouni, Bassem ; Belleudy, Cécile ; Ben Rekhissa, Hajer ; Senn, Eric

  • Author_Institution
    LEAT, Univ. of Nice Sophia-Antipolis, Sophia-Antipolis, France
  • fYear
    2012
  • fDate
    6-8 June 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The leakage energy consumption is substantial and increasing for multiprocessor systems. That is why embedded operating systems adapt power management decisions to the variable characteristics of cores, improving system-wide power consumption and performance. Low power operating systems use key techniques such as Dynamic Voltage Frequency Scaling (DVFS) to save the energy consumption by changing dynamically the supply voltage and operating frequency. When the processor changes the execution from one task to another or vary the core frequency, an amount of energy is consumed. We, in this paper, propose an approach that characterizes the overhead of context switch in low power embedded operating systems. We study the influence of hardware and software parameters on the energy consumption. Then, we extract models of the energy overhead. We apply the proposed approach to multi-process software benchmark programs and we validate its applicability in the context of an embedded system containing an OMAP3530 processor and running embedded Linux as an operating system.
  • Keywords
    Linux; embedded systems; multiprocessing programs; DVFS policy; Linux; OMAP3530 processor; dynamic voltage frequency scaling; energy leakage; low power embedded operating systems; multiprocess software benchmark programs; multiprocessor systems; power management; system-wide power consumption; Context; Energy consumption; Hardware; Operating systems; Power demand; Processor scheduling; Switches; Context switch; DVFS technique; Energy consumption;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Faible Tension Faible Consommation (FTFC), 2012 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-0822-9
  • Type

    conf

  • DOI
    10.1109/FTFC.2012.6231735
  • Filename
    6231735