• DocumentCode
    2509583
  • Title

    Extending ATAM to assess product line architecture

  • Author

    Kim, Taeho ; Ko, In-young ; Kang, Sung-won ; Lee, Dan-hyung

  • Author_Institution
    Samsung Electron. Co. Ltd., Suwon
  • fYear
    2008
  • fDate
    8-11 July 2008
  • Firstpage
    790
  • Lastpage
    797
  • Abstract
    Software architecture is a core asset for any organization that develops software-intensive systems. Unsuitable architecture can precipitate disaster because the architecture determines the structure of the project. To prevent this, software architecture must be evaluated. The current evaluation methods, however, focus on single product architecture, and not product line architectures and they hardly consider the characteristics of the product lines, such as the variation points. This paper describes the extension of a scenario-based analysis technique for software product architecture-called EATAM, which not only analyzes the variation points of the quality attribute using feature modeling but also creates variability scenarios for the derivation of the variation points using the extended PLUC tag approach. This is a method that aims to consider the tradeoffs in the variability scenarios of the software product family architecture. The method has been validated through a case study involving microwave oven software product line in the appliance domain.
  • Keywords
    product life cycle management; software architecture; appliance domain; extended PLUC tag approach; extended architecture tradeoff analysis method; microwave oven software product line; product line architecture assessment; scenario-based analysis technique; software architecture evaluation; software product family architecture; software-intensive systems; Computer architecture; Costs; Design engineering; Home appliances; Microwave ovens; Microwave theory and techniques; Product design; Software architecture; Software quality; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology, 2008. CIT 2008. 8th IEEE International Conference on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    978-1-4244-2357-6
  • Electronic_ISBN
    978-1-4244-2358-3
  • Type

    conf

  • DOI
    10.1109/CIT.2008.4594775
  • Filename
    4594775