• DocumentCode
    2509829
  • Title

    Incoherence analysis and its application to time domain EM analysis of secure circuits

  • Author

    Dehbaoui, Amine ; Ordas, Thomas ; Lomné, Victor ; Maurine, Philippe ; Torres, Lionel ; Robert, Michel

  • Author_Institution
    LIRMM, Univ. Montpellier 2, Montpellier, France
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1039
  • Lastpage
    1042
  • Abstract
    Since several years, Electromagnetic (EM) radiations of ICs are considered as source of noise and interferences from an EM Compatibility (EMC) point-of-view. Electromagnetic interferences (EMI) are unwanted disturbances that affect digital circuits due to electromagnetic conduction or electromagnetic radiation emitted from an internal or external source. Today electromagnetic radiations of ICs also represent vulnerabilities for hardware security modules like smartcards. Recently, from a hardware security point of view, researchers, industrials and governmental agencies are focusing with strong interest on these radiations. This paper aims at introducing a pragmatic technique WGMSI (Weighted Global Magnitude Squared Incoherence) allowing localizing hardware security modules within the whole EM noise generated by the environment or other modules of the circuits.
  • Keywords
    cryptography; digital circuits; electromagnetic compatibility; electromagnetic interference; integrated circuit noise; smart cards; time-domain analysis; IC; digital circuits; electromagnetic compatibility; electromagnetic conduction; electromagnetic interferences; electromagnetic radiations; hardware cryptographic module; hardware security modules; incoherence analysis; noise; smartcards; time domain electromagnetic analysis; weighted global magnitude squared incoherence; Circuit analysis; Circuit noise; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Electromagnetic radiation; Electromagnetic radiative interference; Hardware; Security; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475481
  • Filename
    5475481