DocumentCode :
2509949
Title :
Bhattacharyya Clustering with Applications to Mixture Simplifications
Author :
Nielsen, Frank ; Boltz, Sylvain ; Schwander, Olivier
Author_Institution :
LIX, Ecole Polytech. - Sony CSL, France
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
1437
Lastpage :
1440
Abstract :
Bhattacharrya distance (BD) is a widely used distance in statistics to compare probability density functions (PDFs). It has shown strong statistical properties (in terms of Bayes error) and it relates to Fisher information. It has also practical advantages, since it strongly relates on measuring the overlap of the supports of the PDFs. Unfortunately, even with common parametric models on PDFs, few closed-form formulas are known. Moreover, the BD centroid estimation was limited to univariate gaussian PDFs in the literature and no convergence guarantees were provided. In this paper, we propose a closed-form formula for BD on a general class of parametric distributions named exponential families. We show that the BD is a Burbea-Rao divergence for the log normalizer of the exponential family. We propose an efficient iterative scheme to compute a BD centroid on exponential families. Finally, these results allow us to define a Bhattacharrya hierarchical clustering algorithms (BHC). It can be viewed as a generalization of k-means on BD. Results on image segmentation shows the stability of the method.
Keywords :
Gaussian distribution; generalisation (artificial intelligence); iterative methods; learning (artificial intelligence); pattern clustering; BD centroid estimation; Bhattacharrya hierarchical clustering algorithms; Bhattacharyya distance; Burbea-Rao divergence; Fisher information; iterative scheme; k-means generalization; mixture simplification application; probability density functions; univariate Gaussian PDFs; Clustering algorithms; Conferences; Convergence; Estimation; Kernel; Measurement; Stability analysis; Bhattacharrya; clustering; exponential families;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.355
Filename :
5597536
Link To Document :
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