DocumentCode
2510008
Title
Enhanced Measurement Model for Subspace-Based Tracking
Author
Yin, Shimin ; Yoo, Haan Joo ; Choi, Jin Young
Author_Institution
EECS Dept., Seoul Nat. Univ., Seoul, South Korea
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
3492
Lastpage
3495
Abstract
We present an efficient and robust measurement model for visual tracking. This approach builds on and extends work on measurement model of subspace representation. Subspace-based tracking algorithms have been introduced to visual tracking literature for a decade and show considerable tracking performance due to its robustness in matching. However, the measures used in their measurement models are not robust enough in cluttered backgrounds. We propose a novel measure of object matching referred to as WDIFS, which aims to improve the discriminability of matching within the subspace. Our measurement model can distinguish target from similar background clutters which often cause erroneous drift by conventional DFFS based measure. Experiments demonstrate the effectiveness of the proposed tracking algorithm under cluttered background.
Keywords
image matching; image representation; learning (artificial intelligence); object detection; WDIFS measurement; background clutters; enhanced measurement model; matching discriminability; object matching; subspace representation; subspace-based tracking; visual tracking; weighted difference in feature space; Atmospheric measurements; Mathematical model; Particle measurements; Pollution measurement; Robustness; Target tracking; Visualization; Measurement Model; Subspace; Visual Tracking; Weighted Distance in Subspace;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.852
Filename
5597539
Link To Document