• DocumentCode
    2510008
  • Title

    Enhanced Measurement Model for Subspace-Based Tracking

  • Author

    Yin, Shimin ; Yoo, Haan Joo ; Choi, Jin Young

  • Author_Institution
    EECS Dept., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    3492
  • Lastpage
    3495
  • Abstract
    We present an efficient and robust measurement model for visual tracking. This approach builds on and extends work on measurement model of subspace representation. Subspace-based tracking algorithms have been introduced to visual tracking literature for a decade and show considerable tracking performance due to its robustness in matching. However, the measures used in their measurement models are not robust enough in cluttered backgrounds. We propose a novel measure of object matching referred to as WDIFS, which aims to improve the discriminability of matching within the subspace. Our measurement model can distinguish target from similar background clutters which often cause erroneous drift by conventional DFFS based measure. Experiments demonstrate the effectiveness of the proposed tracking algorithm under cluttered background.
  • Keywords
    image matching; image representation; learning (artificial intelligence); object detection; WDIFS measurement; background clutters; enhanced measurement model; matching discriminability; object matching; subspace representation; subspace-based tracking; visual tracking; weighted difference in feature space; Atmospheric measurements; Mathematical model; Particle measurements; Pollution measurement; Robustness; Target tracking; Visualization; Measurement Model; Subspace; Visual Tracking; Weighted Distance in Subspace;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.852
  • Filename
    5597539