DocumentCode :
2510041
Title :
Intelligent process diagnosis based on end-of-line electrical test data
Author :
Guo, Ruey-Shan ; Tsai, Cheng-Kai ; Lee, Jian-Huei ; Chang, Shi-Chung
Author_Institution :
Dept. of Ind. & Bus. Adm., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
1996
fDate :
14-16 Oct 1996
Firstpage :
347
Lastpage :
354
Abstract :
The goal of this research is to develop a fuzzy logic-based system for a first-cut end-of-line diagnosis function. Based on measured abnormal electrical test data, the system provides the engineers a list of prioritized causes (process steps) for further investigation. The intelligent diagnosis system consists of three major modules: fuzzy modeling, knowledge base and inference engine. Experienced engineers diagnosis knowledge is captured in the knowledge base using fuzzy logic knowledge representation models. Each major processing step´s fault possibility is calculated in the inference engine. The intelligent diagnosis system has been validated against 23 real fab cases. Results show that version 2.0 of the system identifies the real causes as the top three causes in 20 cases. Our analysis indicates that the inference engine is robust but the knowledge base is insufficient. Improvement strategy has been to periodically update the knowledge base by field engineers based on lessons learned from the case study
Keywords :
fuzzy logic; inference mechanisms; knowledge based systems; semiconductor device manufacture; testing; end-of-line electrical test data; fuzzy logic; inference engine; intelligent process diagnosis; knowledge base; semiconductor wafer fab; Data engineering; Electric variables measurement; Engines; Fuzzy logic; Fuzzy systems; Intelligent systems; Knowledge engineering; Knowledge representation; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3642-9
Type :
conf
DOI :
10.1109/IEMT.1996.559754
Filename :
559754
Link To Document :
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