• DocumentCode
    2510085
  • Title

    A Reputation Model Based on Behavior Trust in Wireless Sensor Networks

  • Author

    Zhou, Ming-Zheng ; Zhang, Yi ; Wang, Jun ; Zhao, Sen-Yan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Anhui Univ. of Technol. & Sci., Wuhu, China
  • fYear
    2009
  • fDate
    25-27 Sept. 2009
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    Trust management has an important significance on the reliable operation and safety guarantee in Wireless Sensor Networks(WSNs). Previous works were implemented by exchanging key among neighboring sensors. Considering that in many cases, the sensor nodes´ behavior is both spatio-temporal correlated, and this paper proposes a reputation model called BRMSN (Behavior Reputation Method for Sensor Networks) which focuses on local testing. The model defines the similarity and the similarity matrix by using normal differences among status estimate vectors (or measured values). Using the homogeneity measures that formed by the spatial information between nodes as indirect reputation measurement. Using the reliability measures that formed by the temporal information between nodes as direct reputation measurement. The simulation results show that the model can reduce the number of data exchange among sensors, also our model has the powerful ability to prevent from malicious attacks or faulty nodes.
  • Keywords
    telecommunication network reliability; telecommunication security; wireless sensor networks; behavior trust; reliability measures; reputation model; safety guarantee; temporal information; wireless sensor networks; Authentication; Computer networks; Cryptography; Data security; Embedded computing; Information security; Protection; Sensor phenomena and characterization; Testing; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Scalable Computing and Communications; Eighth International Conference on Embedded Computing, 2009. SCALCOM-EMBEDDEDCOM'09. International Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    978-0-7695-3825-9
  • Type

    conf

  • DOI
    10.1109/EmbeddedCom-ScalCom.2009.42
  • Filename
    5341549