Title :
Two Models of Digital Forensic Examination
Author_Institution :
California Sci. Inst., CA, USA
Abstract :
This paper examines an existing cost model of digital forensic evidence examination, identifies minor optimization improvements to that model, describes a new model, and uses the new model to show some fundamental theoretical limits of examination.
Keywords :
computer crime; forensic science; digital forensic evidence examination; forensic science; trace evidence theory; Clothing; Conferences; Cost function; Digital forensics; Error analysis; Fabrics; Hair; Law; Legal factors; Skin; Digital forensics; analysis; trace consistency;
Conference_Titel :
Systematic Approaches to Digital Forensic Engineering, 2009. SADFE '09. Fourth International IEEE Workshop on
Conference_Location :
Berkeley, CA
Print_ISBN :
978-0-7695-3792-4
DOI :
10.1109/SADFE.2009.8
