Title :
Noise investigation of Terahertz photoconductive emitters
Author :
Hou, L. ; Shi, W. ; Chen, S. ; Du, Y. ; Chen, Y.
Author_Institution :
Dept. of Appl. Phys., Xian Univ. of Technol., Xian, China
Abstract :
The electromagnetic noise generated by terahertz photoconductive emitters was investigated, and the intensity of noise spectrum was analysed by statistical method. The relationship between the noise of the emitter and the resistivity as well as carrier lifetime of the antenna material was obtained. And the effect of carrier lifetime and mobility of antennas on the THz generation efficiency was investigated.
Keywords :
antennas; carrier lifetime; electrical resistivity; noise; photoconducting devices; statistical analysis; terahertz wave devices; terahertz wave generation; THz generation efficiency; antenna material; antenna mobility; carrier lifetime; electromagnetic noise; noise spectrum intensity; statistical method; terahertz photoconductive emitters; Antennas; Charge carrier lifetime; Noise; Resistance; Silicon; Thermal noise;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location :
Wollongong, NSW
Print_ISBN :
978-1-4673-1598-2
Electronic_ISBN :
2162-2027
DOI :
10.1109/IRMMW-THz.2012.6380254
