• DocumentCode
    2510473
  • Title

    Can SAT be used to improve sequential ATPG methods?

  • Author

    Prasad, Mukul R. ; Hsiao, Michael S. ; Jain, Jawahar

  • Author_Institution
    Fujitsu Labs. of America, Sunnyvale, CA, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    585
  • Lastpage
    590
  • Abstract
    In this work we investigate the integration of SAT methods into a simulation-based sequential ATPG tool, STRATEGATE, with the aim of improving the state-of-the-art in sequential ATPG. We offer a detailed analysis of possible scenarios and algorithms for performing such an integration. Our preliminary investigations show that such hybrid approaches can be very promising.
  • Keywords
    automatic test pattern generation; computability; sequential circuits; SAT method integration; automatic test pattern generation; satisfiability methods; sequential ATPG methods; Algorithm design and analysis; Automatic test pattern generation; Boolean functions; Computational modeling; Computer simulation; Data structures; Engines; Laboratories; Manufacturing; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2004. Proceedings. 17th International Conference on
  • Print_ISBN
    0-7695-2072-3
  • Type

    conf

  • DOI
    10.1109/ICVD.2004.1260982
  • Filename
    1260982
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2510473