Title :
Can SAT be used to improve sequential ATPG methods?
Author :
Prasad, Mukul R. ; Hsiao, Michael S. ; Jain, Jawahar
Author_Institution :
Fujitsu Labs. of America, Sunnyvale, CA, USA
Abstract :
In this work we investigate the integration of SAT methods into a simulation-based sequential ATPG tool, STRATEGATE, with the aim of improving the state-of-the-art in sequential ATPG. We offer a detailed analysis of possible scenarios and algorithms for performing such an integration. Our preliminary investigations show that such hybrid approaches can be very promising.
Keywords :
automatic test pattern generation; computability; sequential circuits; SAT method integration; automatic test pattern generation; satisfiability methods; sequential ATPG methods; Algorithm design and analysis; Automatic test pattern generation; Boolean functions; Computational modeling; Computer simulation; Data structures; Engines; Laboratories; Manufacturing; Performance analysis;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1260982
